Thermal Diffusivity & Conductivity

LFA 467 HyperFlash

Light Flash Apparatus

New Dimensions in the Measurement of Thermal Diffusivity and Conductivity – Fast, Simple, Economical 

Broadest temperature range available, from -100°C to 500°C
With a single instrument setup – that is, without having to swap out either the detector or the furnace – the LFA 467 HyperFlash can carry out measurements from -100°C to 500°C. Coupled with the broadest range of accessories available on the market, the instrument opens the door to completely new dimensions in the determination of thermophysical properties.

Sample throughput up to 4 times higher due to sample holder for 16 samples
One unique advantage of the LFA 467 HyperFlash is its ability to simultaneously measure up to 16 samples over the entire temperature range. This allows for maximum sample throughput with a minimum input of operational time and effort.
Refill systems are available for automatic refilling of the Dewar on both the detector and the furnace, allowing uninterrupted operation of the LFA system around the clock.

ZoomOptics for more precise measurement results without measurement errors
The patented ZoomOptics system (patent no.: DE 10 2012 106 955 B4  2014.04.03) optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.

Ultra-fast recording of measurement data for thin samples (2 MHz)
Thin films and high-conductivity materials require a very high data acquisition rate for the precise recording of rapid temperature increases on a sample’s upper surface. The LFA 467 HyperFlash offers a sampling rate of 2 MHz – an unprecedented value for LFA systems.

Technical Data

Temperature range
-100°C to 500°C, with only one single furnace
Contactless measurement
of the temperature increase with IR detector
Data acquisition rate
up to 2 MHz (for both thermal curve and pulse mapping)
Schematic of the LFA 467 HyperFlash; the light beam heats the lower sample surface and an IR detector measures the temperature increase on the upper sample surface

Measuring range thermal diffusivity:
0.01 mm2/s to 2000 mm2/s

Measuring range thermal conductivity:
< 0.1 W/(m*K) to 4000 W/(m*K)

Sample dimensions: 
6 mm to 25.4 mm diameter
0.01 mm to 6 mm thickness

Patented pulse mapping technique
for pulse length correction and improved cp determination

Compliant to and in accordance with:
ASTM E1461, ASTM E2585, DIN EN 821-2, DIN 30905, ISO 22007-4, ISO 18755, ISO 13826; DIN EN 1159-2, etc.


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